Iec 60747 14 1 2000

INTERNATIONAL
STANDARD

IEC
60747-14-1
First edition
2000-10

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Semiconductor devices –
Part 14-1:
Semiconductor sensors –
General and classification
Dispositifs à semiconducteurs –
Partie 14-1:
Capteurs à semiconducteurs –
Généralités et classification

Reference number
IEC 60747-14-1:2000(E)


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INTERNATIONAL
STANDARD

IEC
60747-14-1
First edition
2000-10

LICENSED TO MECON Limited. - RANCHI/BANGALORE
FOR INTERNAL USE AT THIS LOCATION ONLY, SUPPLIED BY BOOK SUPPLY BUREAU.

Semiconductor devices –
Part 14-1:
Semiconductor sensors –

General and classification
Dispositifs à semiconducteurs –
Partie 14-1:
Capteurs à semiconducteurs –
Généralités et classification

 IEC 2000  Copyright - all rights reserved
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60747-14-1 © IEC:2000(E)

CONTENTS
Page

FOREWORD .......................................................................................................................... 3
INTRODUCTION .................................................................................................................... 4
Clause

Scope .............................................................................................................................. 5

2

Normative references ....................................................................................................... 5

3

Definitions........................................................................................................................ 5

4

Semiconductor sensors .................................................................................................... 8

5

Classification scheme for semiconductor sensors ............................................................ 9

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1

60747-14-1 © IEC:2000(E)

–3–

INTERNATIONAL ELECTROTECHNICAL COMMISSION
–––––––––––––
SEMICONDUCTOR DEVICES –
Part 14-1: Semiconductor sensors – General and classification

FOREWORD

2) The formal decisions or agreements of the IEC on technical matters express, as nearly as possible, an
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3) The documents produced have the form of recommendations for international use and are published in the form
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4) In order to promote international unification, IEC National Committees undertake to apply IEC International
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equipment declared to be in conformity with one of its standards.
6) Attention is drawn to the possibility that some of the elements of this International Standard may be the subject
of patent rights. The IEC shall not be held responsible for identifying any or all such patent rights.

International Standard IEC 60747-14-1 has been prepared by subcommittee 47E: Discrete
semiconductor devices, of IEC technical committee 47: Semiconductor devices.
The text of this standard is based on the following documents:

FDIS

Report on voting

47E/157/FDIS

47E/170/RVD

Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 3.
The committee has decided that the contents of this publication remain unchanged until 2005.
At this date, the publication will be
•
•
•
•

reconfirmed;
withdrawn;
replaced by a revised edition, or
amended.

A bilingual version of this standard may be issued at a later date.

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1) The IEC (International Electrotechnical Commission) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of the IEC is to promote

international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, the IEC publishes International Standards. Their preparation is
entrusted to technical committees; any IEC National Committee interested in the subject dealt with may
participate in this preparatory work. International, governmental and non-governmental organizations liaising
with the IEC also participate in this preparation. The IEC collaborates closely with the International
Organization for Standardization (ISO) in accordance with conditions determined by agreement between the
two organizations.


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60747-14-1 © IEC:2000(E)

INTRODUCTION
This part of IEC 60747 should be read in conjunction with IEC 60747-1. It provides basic
information on semiconductor
–

terminology;

–

letter symbols;

–

essential ratings and characteristics;

–

measuring methods;

–

acceptance and reliability.

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60747-14-1 © IEC:2000(E)

–5–

SEMICONDUCTOR DEVICES –
Part 14-1: Semiconductor sensors – General and classification

1

Scope

2

Normative references

The following normative documents contain provisions which, through reference in this text,
constitute provisions of this part of IEC 60747. For dated references, subsequent
amendments to, or revisions of, any of these publictions do not apply. However, parties to
agreements based on this part of IEC 60747 are encouraged to investigate the possibility of
applying the most recent editions of the normative documents indicated below. For undated

references, the latest edition of the normative document referred to applies. Members of ISO
and IEC maintain registers of currently valid International Standards.
IEC 60721-2-1:1982, Classification of environmental conditions – Part 2: Environmental
conditions appearing in nature – Temperature and humidity
IEC 60721-3-0:1984, Classification of environmental conditions – Part 3: Classification of
groups of environmental parameters and their severities – Introduction
Amendment 1 (1987)
IEC 60747-1:1983, Semiconductor devices – Discrete devices – Part 1: General

3

Definitions

For the purpose of this International Standard, the following definitions apply. This clause
states terms and definitions with letter symbols used for sensors.
3.1
ambient conditions allowed
ambient conditions that may have serious effects on sensor operation such as temperature,
acceleration, vibration, shock, ambient pressure (e.g. high altitudes), moisture, corrosive
materials, and electromagnetic field
NOTE 1 The allowed ambient conditions for a sensor should be specified so that the sensor can perform within its
specified tolerance.
NOTE 2

Refer to IEC 60721-2-1 and IEC 60721-3-0 for basic conditions.

3.2
full scale span (FSS)
the algebraic difference between the end-points of the output
NOTE The upper limit of sensor output over the measuring range is called the full scale output (FSO) which is the

sum of the offset signal plus the full scale span (see figure 1).

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This part of IEC 60747-14 describes general items concerning the specifications for sensors,
which are the basis for specfications given in other parts of this series for various types of
sensors. Sensors described in this standard are basically made of semiconductor materials;
however, the statements made in this standard are also applicable to sensors using materials
other than semiconductor, for example dielectric and ferroelectric materials.


–6–

60747-14-1 © IEC:2000(E)

Output
(e.g. voltage)

Full scale span (FSS)

Full scale
output (FSO)

Offset
Measuring range

100 %

Measurand

(e.g. pressure)
IEC 1869/2000

Figure 1 – Output-measurand relationship of a linear-output sensor with an offset

3.3
hysteresis
the maximum difference in output, at any measurand value, within the measuring range when
the value is approached first with an increasing and then decreasing measurand (see figure 2)
NOTE

Hysteresis is expressed in percent of FSO during one calibration cycle.

3.4
linearity
the closeness between the calibration curve and a specified straight line
NOTE There are two basic methods for calculating linearity: end-point straight line fit or a least squares best line
fit. While a least squares fit gives the "best case" linearity error (lower numerical value), the calculations required
are burdensome. Conversely, an end-point fit will give the "worst case" error (often more desirable in error budget
calculations) and the calculations are more straightforward. The result is called the end-point or terminal linearity.

3.5
measuring range
the set of values for a measurand for which the error of a measuring instrument is intended to
lie within specified limits (see figure 1)
NOTE 1 The upper and lower limits of the specified measuring range are sometimes called "maximum capacity"
and "minimum capacity", respectively.
NOTE 2 In some other fields of knowledge, "range" is used to mean the difference between the greatest and the
smallest values.

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0


60747-14-1 © IEC:2000(E)

–7–

Output

Repeatability

Hysteresis

Start

Percent

100

Measurand
IEC 1870/2000

Figure 2 – Hysteresis and repeatability

3.6
offset
the output of a sensor, under room-temperature condition, unless otherwise specified, with

zero measurand applied (see figure 1)
3.7
operating life
the minimum duration over which the sensor will operate, either continuously or over a
number of on-off cycles whose duration is specified, without changing performance
characteristics beyond specified tolerances
3.8
output quantity
quantity, usually electrical and a function of the measurable, produced by a sensor
NOTE 1 The output format includes analogue output (e.g. a continuous function of the measurand, such as
voltage amplitude, voltage ratio, and changes in capacitance).
NOTE 2 Frequency output (i.e. the number of cycles or pulses per second as a function of the measurand) and
frequency-modulated output (i.e. frequency deviation from a centre frequency) are also forms of analogue output.
NOTE 3 Another output format is the digital output which represents the measurand in the form of discrete
quantities coded in some system of notation (e.g. binary code).

3.9
overload (or overrange)
the maximum magnitude of measurand that can be applied to a sensor without causing a
change in performance beyond specified tolerances
NOTE A key parameter of the overload characteristics is the recovery time, which is the amount of time allowed to
elapse after removal of an overload condition before the sensor performs again within the specified tolerances.

3.10
repeatability
the ability of a sensor to reproduce output readings at room temperature, unless otherwise
specified, when the same measurand is applied to it consecutively, under the same conditions
and in the same direction (see figure 2)
NOTE It is expressed as the maximum difference between output readings as determined by two calibration
cycles (see figure 2). It is usually stated as "within × % FSO".

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60747-14-1 © IEC:2000(E)

3.11
resolution
the minimal change of the measurand value necessary to produce a detectable change at the
output
NOTE

When the measurand increment is from zero, it is called the threshold.

3.12
selectivity
the ability of a sensor to measure one measurable (e.g. one chemical component) in the
presence of others
3.13
sensitivity
the quotient of the change in sensor output to the change in the value of the measurable

S( x a ) =

dy

dx x = x
a

NOTE 2 It is desirable to have a high and, if possible, constant sensitivity. For a sensor having y = k x +b, where k
and b are constants, the sensitivity S is k for the entire measuring range. For a sensor having y = k x 2 +b, the
sensitivity S is 2 k x and changes from one point to another over the measuring range.

3.14
sensor
device which is affected by the measurand (stimulus) and provides an output quantity
(response)
3.15
span
modulus of the difference between the two limits of the range and applies to measurand and
output
3.16
stability
the ability of a sensor to maintain its performance characteristics for a certain period of time
NOTE Unless otherwise stated, stability is the ability of a sensor to reproduce output readings, obtained during
the original calibration, and under constant room conditions, for a specified period of time. It is typically expressed
as a percentage of FSO.

3.17
time of response
the time interval, with the apparatus in a warmed-up condition, between the time when an
instantaneous variation in volume ratio is produced at the apparatus inlet and the time when
the response reaches a stated percentage (x) of the final indication

4

Semiconductor sensors

The word "sensor" is derived from the Latin word sentire which means "to perceive". The word
"sensor" has some connection with our human senses. It may provide us with information
about physical and chemical signals, which could not otherwise be directly perceived by our
senses, by detecting an input signal (or energy) and converting it to another form of output
signal (or energy). The Concise Oxford Dictionary states the word "sensor" as "a device that
responds to a physical (or chemical) stimulus (such as heat, light, sound, pressure,
magnetism, or particular motion) and transmits a resulting impulse (as for measurement or
operating a control)". Semiconductor sensors are semiconductor devices in which the
semiconductor materials are mainly responsible for sensing.

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NOTE 1 It is the slope of the calibration curve (see figure 1). For a sensor in which the output y is related to the
measurand x by the equation y = f ( x ), the sensitivity S ( x a ), at point x a is:


60747-14-1 © IEC:2000(E)

–9–

Another term closely related to sensor is "transducer" which is derived from the Latin word
transducere , meaning "to lead across". Signals as well as energy can be "lead across" a
transducer, as it is a device that converts energy from one system to another in the same or
in a different form. The essential differences between sensors and transducers are not
significant. A sensor performs a transducing action and the transducer shall of course sense
some signals of the surrounding environment.

5

Classification scheme for semiconductor sensors

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Table 1 lists the measurands which are defined as the input quantities, properties, or
conditions that are to be detected or measured by sensors. For example, if the measurand is
heat, it is measured by a thermal sensor; if it is pressure, it is measured by a pressure sensor.
The measurands, arranged in alphabetical order, are: acoustic, biological, chemical,
electrical, magnetic, mechanical, optical, radiational, and thermal properties. Each entry in
table 1 not only represents the measurand itself, but also its temporal or spatial distribution.


– 10 –

60747-14-1 © IEC:2000(E)

Table 1 – Measurands

1

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Acoustic
1.1 Wave amplitude, phase, polarization, spectrum
1.2 Wave velocity
1.3 Other (specify)

2 Biological
2.1 Biomass (identities, concentrations, states)
2.2 Other (specify)
3 Chemical
3.1 Components (identities, concentrations, states)
3.2 Other (specify)
4 Electrical
4.1 Charge, current
4.2 Potential, potential difference
4.3 Electric field (amplitude, phase, polarization, spectrum)
4.4 Conductivity
4.5 Permittivity
4.6 Other (specify)
5 Magnetic
5.1 Magnetic field (amplitude, phase, polarization, spectrum)
5.2 Magnetic flux
5.3 Other (specify)
6 Mechanical
6.1 Position (linear, angular)
6.2 Velocity
6.3 Acceleration
6.4 Force
6.5 Stress, pressure
6.6 Strain
6.7 Mass, density
6.8 Moment, torque
6.9 Speed or flow, rate of mass transport
6.10 Shape, roughness, orientation
6.11 Stiffness, compliance
6.12 Viscosity

6.13 Crystallinity, structural integrity
6.14 Level (of liquid)
6.15 Other (specify)
7 Optical
7.1 Wave amplitude, phase, polarization, spectrum
7.2 Wave velocity
7.3 Other (specify)
8 Radiation
8.1 Type
8.2 Energy
8.3 Intensity
8.4 Other (specify)
9 Thermal
9.1 Temperature
9.2 Flux
9.3 Specific heat
9.4 Thermal conductivity
9.5 Other (specify)
10 Humidity
10.1 Humidity, moisture
11 Other (specify)


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