COMSATS Institute of Information Technology
Virtual campus
Islamabad
Dr. Nasim Zafar
Electronics 1
EEE 231 – BS Electrical Engineering
Fall Semester – 2012
Carrier Transport in Semiconductors
Lecture No: 4
v
v
Drift and Mobility
Conductivity and Resistance
v
Continuity Equations
v
Einstein Relation
Kwangwoon
University
Nasim Zafar
Semiconductor device lab.
Semiconductor Devices.
Introduction:
Ø
In the first few lectures we discussed and calculated the
equilibrium distribution of charges in a semiconductor.
n.p = ni2, n ~ ND for ntype
Ø
last lecture showed how the system tries to restore itself
back to equilibrium when perturbed, through R G processes.
R = (n p ni2)/[tp(n+n1) + tn(p+p1)]
Ø
In this lecture we will explore the processes that drive the system
away from equilibrium.
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Introduction:
The carrier transport or the mechanisms which cause
charges to move in semiconductors can be classified into two
categories. Both these mechanisms will be discuss in this
lecture.
The two mechanisms are:
Ø
Drift: DriftMotion under an applied electric field.
Ø
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diffusion: DiffusionMotion due to the concentration
The Drift Motion
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An Applied Electric Field Across: ntype Si
+
V
-
E
n – type Si
Vd
V
L
e-
Electric field
Electron movement
Current flow
Current carriers are mostly electrons.
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+
V
-
An Applied Electric Field
V
E
L
Across: Ptype Si
p– type Si
hole
Vd
Electric field
Hole movement
Current flow
Current carriers are mostly holes.
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The Thermal Velocity:
Ø
Ø
For free charge carriers the thermal energy and the thermal
velocity is given by:
From classical thermal physics,
1
KE
*
m v th
2
2
3
2
kT
1
or
Ø
v th
3kT
2
*
m
107 cm/s in Si
where vth is the thermal velocity, which is the average velocity
of carriers due to thermal excitation.
The Concept of Driftunder an applied Electric Field:
Random scattering
events (RG centers)
The electric field gives a net
drift, superposed on top
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The Concept of Driftunder an Electric Field:
Ø
If an electric field, Ex, is applied along the xdirection to the
Si sample, each electron will experience a net force qEx
from
F = qE
the field, given by:
Ø
This force may be insufficient to alter, appreciably, the
random thermal motion of an individual electron, however,
there is a net motion of the group in the xdirection.
Ø
When electrons collide with the lattice and impurity atoms,
Scattering Processes
Ø
Phonon Scattering
Ø
Ionized Impurity Scattering
Ø
Neutral Atom/Defect Scattering
Ø
CarrierCarrier Scattering
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Drift Velocity and Mobility:
Ø
Net carrier velocity in an applied field is the drift velocity vd
Ø
Drift velocity = Acceleration x Mean free time
F
Vd = *
m
Ø
τ
Force is due to the applied field, F=qE
Vd =
F
m*
τ =
qE
τ
*
m
Vd = µ E � µ =
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qτ
m∗
12
Carrier Mobility
:
Vd
E
Vd = µ E
is a proportionality factor and is defined as mobility
of the charge carriers.
cm
2
V Sec
So is a measure of how easily charge carriers move under the
influence of an applied field or determines how mobile the charge
carriers are.
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The Concept of Drift Motion and Drift Current:
Ø
The force exerted by the field, on n electrons/cm3 is:
(where px , momentum of the group)
n q
acceleration of
x
dp x
Is this a continuous
dt
electrons in the–x direction?
Id
Ø
The drift motion of these electrons, gives a drift current
I = nqV A
d
d
I d : drift current
Vd : drift velocity of charge carrier
A:
area of the semiconductor
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n : number of charge carriers per unit
volume
q : charge of t he electron
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Carrier Mobility
qτ
µ= *
m
Thus:
me* mh* in general
m ; n − type
*
e
m ; p − type
*
h
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Carrier Mobility :
Ø
There are the two basic types of scattering mechanisms that hinder
mobility. Thus the mobility has two components:
Impurity interaction
component
Lattice interaction
component
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Lets Solve a Problem:
Ø
Ø
Calculate the velocity of an electron in an ntype silicon sample due to its
thermal energy at room temperature.
and due to the application of an electric field of 1000 V/m across the
Silicon sample.
Vth = ?
Vd = ?
V
th
=
RT = 300 K
E = 1000 V / m
me* = 1.18 m0
µ = 0.15 m 2 /(V − s )
3kT
5
�
V
=
1.08
x
10
m / sec
th
∗
m
Vd = µ E � Vd = 150 m / sec
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Temperature Dependence
of Mobility
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Variation of mobility with temperature
At high temperatures
L
component becomes significant.
L
decreases when temperature increases.
L
C1
T
3
2
T
3
2
C1 is a constant.
It is called as a power law.
T −1.5
Carriers are more likely scattered by the lattice atoms.
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Variation of mobility with temperature
At low temperatures
I
I
component is significant.
decreases when temperature decreases.
I
C2 T
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2
C2 is a constant.
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Mobility and Scattering: Lattice and Impurity
Ø
Ø
Lattice vibrations: due to
temperature.
Ionized impurity scattering:
slow moving carriers are easily
affected by a charged ion.
Net Mobility
1
1
i
i
1
~i
1
l
Temperature Dependence of Mobility
T
T
Low temperature
High temperature
1
1
1
=
+
µT µ L µ I
ln( )
µL
I
Peak depends on
the density of
impurities
ln( T )
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Current Density
and
Conductivity
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Conductivity and Resistance
Ø
The semiconductor bar contains
both electrons and holes, the
conductivity is given by
•
•
•
Ø
Ø
Electric field
Current
Hole motion
Electron motion
The resistance of the bar is given
L
L 1
by: R
wt
wt
Where ρ is the resistivity
I
Electron motion
Ohm’s Law
drift
Jn = E/ρn
drift
Jp = E/ρp
E = V/L
L
A
I = JA = V/R
V
R = ρ L/A (Ohms)
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