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I E C 61 67 1 -5
®

Edition 1 .0 201 6-04

I N TE RN ATI ON AL I E E E S td 1 67 1 . 5 ™
S TAN D ARD

IEC 61 671 -5:201 6-04(en) IEEE Std 1 671 .5-201 5

S tan d ard for au tom ati c tes t m arku p l an g u ag e (ATM L) tes t ad apter d es cri pti on


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I E C 61 67 1 -5

®

Edition 1 .0 201 6-04

I N TE RN ATI ON AL I E E E S td 1 67 1 . 5™
S TAN D ARD

S tan d ard for au tom ati c tes t m arku p l an g u ag e (ATM L) tes t ad apter d es cri pti on

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
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I EC

ISBN 978-2-8322-3267-5

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Contents
1 . Overview . .. .. . .. .. .. .. .. . .. .. .. .. .. .. . .. .. .. .. .. .. . .. .. .. .. .. . .. .. .. .. .. .. . .. .. .. .. .. .. . .. .. .. .. .. .. . .. .. .. .. . . . .. .. .. .. .. .. . .. .. .. .. .. .. . .. .. .. .. .. .. . .. .. . 1
1 .1 General . .. .. . .. .. .. .. .. .. . .. .. .. .. .. . .. .. .. .. .. .. . .. .. .. .. .. .. . .. .. .. .. .. . .. .. .. .. .. .. . .. .. .. .. .. .. . .. .. .. .. . . .. . .. .. .. .. .. .. .. .. . .. .. .. .. .. . .. .. .. .. .. 1
1 .2 Application of this document’ s annexes . .. .. .. . .. .. . .. .. .. . .. .. .. . .. .. .. . .. .. . .. .. .. . .. .. .. . .. .. .. . .. .. . .. .. .. . .. .. .. . .. .. ... .. .. .. .. 2
1 .3 Scope . . .. .. .. .. . .. .. .. . .. .. .. .. . .. .. .. .. . .. .. .. .. . .. .. .. .. . .. .. .. . .. .. .. .. . .. .. .. .. . .. .. .. .. . .. .. .. .. . .. .. . . . .. .. .. .. . .. .. .. .. .. . .. .. .. .. .. .. . .. .. .. .. .. 2
1 .4 Application .. .. . .. .. .. .. .. . .. .. .. .. .. .. . .. .. .. .. .. .. . .. .. .. .. . . . .. .. .. .. .. .. . .. .. .. .. .. .. . .. .. .. .. .. .. . .. .. .. .. .. . .. .. .. ... .. .. . .. .. .. .. .. . .. .. .. .. .. 2
1 .5 Conventions used within this document .. .. .. . .. .. .. . .. .. .. .. . .. .. .. .. . .. .. .. .. . . . .. .. . .. .. .. .. . .. .. .. .. . .. .. .. .. . .. .. .. .. . .. .. .. .. . . 2

2. Normative references .. .. .. .. .. .. . .. .. .. .. .. .. . .. .. .. .. .. . .. . . .. .. .. .. . .. .. .. .. .. .. . .. .. .. .. .. .. . .. .. .. .. .. . .. .. .. .. .. .. . .. ... .. . .. .. .. .. .. .. . .. .. .. .. . 3
3 . Definitions, acronyms, and abbreviations . .. .. . .. .. . .. .. .. . .. .. .. . .. .. .. . .. .. . .. .. .. . .. .. .. . .. .. .. . .. .. .. . .. .. . .. .. .. . .. .. ... .. .. . .. .. .. .. . 4
3 .1 Definitions .. .. .. . .. .. .. .. .. .. . .. .. .. .. .. . .. .. .. .. .. .. . .. .. .. .. .. .. . .. .. .. .. .. . .. .. .. .. .. .. . .. .. .. .. . . .. . .. .. .. .. .. .. . .. .... .. .. . .. .. .. .. .. . .. .. .. .. .. 4
3 .2 Acronyms and abbreviations .. .. .. . .. .. .. . .. .. . .. .. .. . .. .. .. . .. .. .. . .. .. . .. .. .. . .. .. .. . .. .. .. . .. .. . .. .. .. . .. .. .. . .. .. .. . .. .... .. . . . .. .. .. .. 5
4. TestAdapterDescription Schema . .. .. .. .. .. .. .. . .. .. .. .. .. .. .. .. .. .. .. . .. .. .. .. .. .. .. .. .. .. . .. .. .. .. .. .. .. .. .. .. .. . .. .. .. .. .. . .. .. .. .. . .. .. .. .. . 5
4.1 General . .. .. . .. .. .. .. .. .. . .. .. .. .. .. . .. .. .. .. .. .. . .. .. .. .. .. .. . .. .. .. .. .. . .. .. .. .. .. .. . .. .. .. .. .. .. . .. .. .. .. . . .. . .. .. .. .. .. .. .. .. . .. .. .. .. .. . .. .. .. .. .. 5
4.2 Elements .. .. .. . .. .. .. .. .. .. . .. .. .. .. .. . .. .. .. .. .. .. . .. .. .. . . .. .. . .. .. .. .. .. . .. .. .. .. .. .. . .. .. .. .. .. .. . .. .. .. .. .. .. . .. .. .. ... .. .. . .. .. .. .. .. . .. .. .. .. .. 6
4.3 Simple types .. . .. .. .. .. . .. .. .. . .. .. .. .. . .. .. .. .. . .. .. .. .. . .. .. . . .. . .. .. .. . .. .. .. .. . .. .. .. .. . .. .. .. .. . .. .. .. .. . .. .. .. . .. .. ... .. . .. .. .. .. .. . .. .. .. .. .. 7
5. Schema—TestAdapterInstance.xsd .. .. .. .. . .. .. .. .. . .. .. .. .. . .. .. .. . .. .. .. .. . .. .. .. .. . .. .. .. .. . .. .. .. . .. . . .. .. . .. .. .. .. . .. .. .. .. .. .. . .. .. .. .. . 7
5.1 General . .. .. . .. .. .. .. .. .. . .. .. .. .. .. . .. .. .. .. .. .. . .. .. .. .. .. .. . .. .. .. .. .. . .. .. .. .. .. .. . .. .. .. .. .. .. . .. .. .. .. . . .. . .. .. .. .. .. .. .. .. . .. .. .. .. .. . .. .. .. .. .. 7
5.2 Elements .. .. .. . .. .. .. .. .. .. . .. .. .. .. .. . .. .. .. .. .. .. . .. .. .. . . .. .. . .. .. .. .. .. . .. .. .. .. .. .. . .. .. .. .. .. .. . .. .. .. .. .. .. . .. .. .. ... .. .. . .. .. .. .. .. . .. .. .. .. .. 8
5.3 Simple types .. . .. .. .. .. . .. .. .. . .. .. .. .. . .. .. .. .. . .. .. .. .. . .. .. . . . .. .. .. .. . .. .. .. .. . .. .. .. .. . .. .. .. .. . .. .. .. . .. .. .. .. . .. .. ... .. . .. .. .. .. .. . .. .. .. .. .. 9
6. ATML TestAdapterDescription XML schema names and locations .. .. .. .. .. .. . .. .. .. .. .. .. .. .. .. .. .. . .. .. . . .. .. .. .. .. .. .. . . 9
7. ATML XML schema extensibility . .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. . .. .. . .. .. .1 1
8. Conformance .. .. . .. .. .. .. . .. .. .. . .. .. .. .. . .. .. .. .. . .. .. .. .. . .. . . .. .. . .. .. .. . .. .. .. .. . .. .. .. .. . .. .. .. .. . .. .. .. . .. .. .. .. . .. .. .. .. .. . .. .. .. .. . .. .. .. .. . .. .. .1 1
8.1 Conformance of a TestAdapterDescription instance document . .. .. .. . .. .. .. . .. .. .. .. . .. .. .. .. . .. .. .. .. . .. .. .. .. . .. .. .. . 1 1
8.2 Conformance of a TestAdapterInstance instance document .. . .. .. . .. .. . .. .. . .. .. . .. .. . .. .. .. . .. .. . .. .. . .. .. . .. .. . .. .. . .. .1 2
Annex A (informative) IEEE download website material associated with this document .. .. .. .. .. .. . .. .. .. .. .. .. .. .1 3
Annex B (informative) Users information and examples .. .. .. .. . .. .. .. .. . .. .. .. .. . .. .. .. . .. .. .. .. . .. .. .. .. . .. .. .. .. . .. .. .. . .. .. .... . .1 4
B.1 Interface test adapter . .. .. . .. .. .. .. .. .. . .. .. .. .. .. .. . .. .. .. .. .. . . . .. .. .. .. .. . .. .. .. .. .. .. . .. .. .. .. .. .. . .. .. .. .. .. .. . .. .. .. . .. .. . .. .. .. . .. .. .. . .1 4
Annex C (informative) Glossary . .. . .. .. .. .. . .. .. .. .. . .. .. .. .. . .. .. .. . .. .. .. .. . .. .. .. .. . .. .. .. .. . .. .. .. .. . .. .. .. . .. .. .. .. . .. .. .... .. .. . .. .. .. .. . .. .1 6
Annex D (informative) Bibliography . .. . .. .. .. .. . .. .. .. .. . .. .. .. . .. .. .. .. . .. .. .. .. . .. .. .. .. . .. .. .. .. . .. .. .. . .. .. .. .. . .. .. .. .. . ... .. .. . .. .. .. .. . .1 7

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IEC
I EEE

61 6 71 -5: 201 6

S td

1 671 . 5-201 5

Standard for Automatic Test
Markup Language (ATML) Test Adapter
Description

F O RE W O RD

1 )

Th e
al l

I n t e rn a t i o n a l
n a ti o n a l

i n t e rn a t i o n a l
th i s

en d

c o - o p e ra t i o n

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in

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th e

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p ro c e s s ,

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of

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is

an d

an d

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(se e

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fi e l d s .

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to

as

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“I EC

i n t e re s t e d

g o v e rn m e n t a l

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non-

p re p a ra ti o n .

i ts

v a ri e d

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v i e wp o i n t s

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th e

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an d

( h e re a ft e r

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a c c u ra c y

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d e ve l o p s

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ob j e ct

Gu i des

w o rk .
in

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p ro m o t e

in

co m m i tte e s ;

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m e m b e rs

to

d ocu m e n ts

l eg al

(P AS )

v o l u n t e e rs

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I n t e rn a t i o n a l

p a rt i c i p a t e

I EEE

n e c e s s a ri l y

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n o ti ce s

wi t h i n

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s t a n d a rd i z a t i o n

p r e p a ra t o r y

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o rg a n i z a ti o n

C o m m i tte e s ) .

te ch n i ca l

th i s

I EC

to g e th e r

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wo rl d wi d e

pu bl i sh es

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d e ve l o p e d

b ri n g s

a

S p e c i fi c a t i o n s

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an d

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( I E E E - S A)

wh i c h

p ro c e s s

is

l i ai sin g

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s t a n d a rd s .

m ay

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a d m i n i s t e rs

wi t h

d o cu m e n ts

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c o n c e rn i n g

a cti vi ti e s ,

p re p a ra t i o n

(I E C)

(I E C

q u e s ti on s

oth er

o rg a n i z a t i o n s

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I EEE

all

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s u b j e ct

g o v e rn m e n t a l

to

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co m m i tte e s

on

a d d i ti o n

P u b l i ca ti o n ( s )” ).
in

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e l e c t ro t e c h n i c a l

wi t h o u t

co n s e n s u s

an y

I EEE

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th e

C o m m i tte e s

t h ro u g h

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i n fo rm a t i o n
a re

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co m p e n s a ti on .

d e ve l o p m e n t

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to

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p ro c e s s ,

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m ade

a va i l a b l e

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in

i ts

fo r

fo r

use

m o re

i n fo rm a t i o n ) .

IEC

co l l a b o ra te s

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in

co n d i ti o n s

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by

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b e t we e n

th e

t wo

o rg a n i z a t i o n s .

2)

Th e

fo rm a l

opi n i on
N a ti o n a l
an d

d e ci s i o n s

on

th e

C om m i tte e s .

S t a n d a rd s

i n t e re s t e d

3)

p a rt i e s

P u b l i ca ti o n s

In

con te n t

th e y

o rd e r

a re

to

sh al l

I EEE

assessm en t

i n d i c a te

g i ve n

i n te rn a ti o n a l

d i v e rg e n c e

p ro v i d e
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in

fo r a n y s e rv i c e s

c a rri e d

ou t

e n s u re

th a t

7)

No

e xp e rt s
an d
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or

an d

th e

any
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p e rs o n a l

co s ts

I E C /I E E E

8)

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is

Atte n ti o n
m a t e ri a l

( i n cl u d i n g

d ra wn

is

e xi s t e n c e

va l i d i ty

or

con n e cti o n

va l i d i ty

E s s e n ti a l

wi t h

of

an d

th e

ri s k

or

p ro p e rt y
l egal

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an y

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of th i s

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m ad e

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to

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th a t

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wa y

in

an d

u n d e rt a k e

th e

to

in

appl y

th e i r

IEC

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n a ti on a l

c o rre s p o n d i n g

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re g i o n a l

or

re g i o n a l

th e

o f th i s

IEC

bod i es

an d

IEEE

p ro v i d e
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n ot

c o n fo rm i t y

re s p o n s i b l e

p u b l i ca ti on .

e m p l o ye e s ,

N a ti o n a l

I EEE

d am age
a ri s i n g

S ta n d a rd s
of

an y

out

of

s e rva n t s

C om m i tte e s ,

a g e n ts

i n cl u d i n g

i n d i vi d u a l

v o l u n t e e rs

of

As s o ci a ti o n

( I E E E - S A)

S t a n d a rd s

n a t u re

th e

or

or

w h a t s o e v e r,

p u b l i ca ti on ,

use

wh e t h e r
o f,

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i n d i re c t ,

u pon ,

th i s

P u b l i ca ti on s .

ci te d

in

th i s

p u b l i ca ti on .

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of

th e

re fe r e n c e d

p u b l i ca ti o n s

is

p u b l i ca ti o n .

of

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co n n e cti o n
a

m ay

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if

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I EEE.

I E C /I E E E

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no
or

any

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in

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fo r

l i ce n s i n g
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th a t

t h e i r o wn

© 201 5

P u b l i ca ti o n

p o s i ti o n

r e q u i re d ,

a d vi s e d

e n ti re l y

fro m

th i s

be

wh e t h e r

e xp re s s l y

ri g h t s ,

of

s t a n d a rd ,

t h e re wi t h .

l i cen s e

A s s u ra n c e ,
a re

c e rt i fi c a t i o n

o f c o n fo rm i t y .

bod i es.

I EC

d e t e rm i n i n g

of s u ch

h el d

co n s e n s u s

i n t e re s t e d

B o a rd .

an d

a re

possi bl e

I n d epen d en t

m a rk s

i m p l e m e n ta ti o n

in

s t a n d a rd

o f i n fri n g e m e n t

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and

oth e r

wh i c h

of

e xt e n t

P u b l i ca ti o n

d i re c t o rs ,

p u b l i ca ti on

or

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C o m m i tt e e s

m a xi m u m

e d i ti o n

of

o f th i s

th a t

fo r

Cl ai m s
of

or

to

th e i r

re fe re n c e s

ri g h ts

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Fi n al

use

be

al l

b a l a n ce d

e ffo rt s

ca n n ot

fro m

u s e r.

c o n fo rm i t y .

e xp e n s e s

By

a

S t a n d a rd s

i n te rn a ti o n a l

I EEE

i n t e rn a t i o n a l

co n s e n s u s

by

s t a n d a rd .

re a s o n a b l e

or

N a ti on a l
th e

c e rt i fi c a t i o n

or I EEE

a p p l i ca ti o n

ri g h t s .

P a te n t

of

C om m i tte e s

fe e s )

to

l a te s t

or

d am ag e

I EC

on ce

( I E E E - S A)

fo r

al l

an y en d

I EC

co m m i tte e s

p o s s i b i l i ty

p a te n t

by

a cce s s

th e

I EEE

n o rm a ti ve

su bm i ssi on

n o n - d i s c ri m i n a t o r y .
ri g h t s ,

h ave

te c h n i ca l

c o rr e c t

to

by

s cop e

I EC

a re a s ,

p ro p o s e d

an

r e p re s e n t a t i o n

l a t t e r.

i n d epen d en t

th e y

a c c u ra t e ,

I E C /I E E E

a tte s ta ti on

som e

by

th e

While

possi bl e,

d e t e rm i n e d

As s o c i a t i o n

sen se.

is

an y

in

th e

as

h as

m a t t e rs ,

is

re c o m m e n d a t i o n s

u n i fo rm i t y ,

or an y oth er I E C

to

fo r t h e

d ra wn

or

i d e n t i fy i n g

of

i n j u ry ,

co ve re d

to

an y

n e a rl y

te ch n i c a l

r e v i e wi n g

th a t

b e t we e n

C o o rd i n a t i n g

P u b l i ca ti on

i n d i spen sabl e

9)

a tta ch

S t a n d a rd s

of

in

as

co m m i tte e

re a c h e d ,

S t a n d a rd s

t ra n s p a re n t l y

c l e a rl y i n d i c a t e d

n ot

sh al l

fo rm

on

been

m i s i n t e rp re t a t i o n

Al l

l i abi l i ty

th e

in

I EEE

S o ci e ti e s

of I E EE

has

i n t e re s t

th e

e xp re s s ,

te ch n i ca l

o r fo r a n y

s e rv i c e s

sh ou l d

by

h a ve

6)

u s e rs

d e ci s i on s

C om m i tte e s

P u b l i ca ti o n s )

be

do

e a ch

P u b l i ca ti o n s

u sed

An y

m a t t e rs

s i n ce

I E C /I E E E

p ro m o te

p u b l i ca ti on

an d

of

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p u b l i ca ti on s .

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IEEE Standard for Automatic Test
Markup Language (ATML) Test Adapter
Description
Sponsor

IEEE Standards Coordinating Committee 20 on
Test and Diagnosis for Electronic Systems
Approved 26 March 201 5

IEEE-SA Standards Board

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Abstract: An exchange format using extensible markup language (XML) for identifying all of the
hardware, software, and documentation associated with a test adapter is specified in this
document. This test adapter may be used as a component of a test program set to test and
diagnose a unit under test.
Keywords: ATML instance document, automatic test equipment (ATE), automatic test markup
language (ATML), automatic test system (ATS), IEEE 1 671 .5™ , interface device (ID), interface

test adapter (ITA), test adapter, test fixture, XML schema
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I ??? ntroduction
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This introduction is not part of IEEE Std 1 671 . 5™-201 5, IEEE Standard for Automatic Test Markup Language
(ATML) Test Adapter Description.

This child, or dot, standard, also known as an ATML component standard, provides for the definition of the
Test Adapter XML schemas, and contains references to examples; both of which accompany this standard.
These XML schemas provide for the identification and definition of a test adapter.
ATML’ s XML schemas define the basic information required within any test application and provide a
vehicle for formally defining the test environment by defining a class hierarchy corresponding to these
basic information entities and provide several methods within each to enable basic operations to be
performed on these entities. ATML component standards within the ATML framework define the
particular requirements within the test environment.

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Important Notices and Disclaimers Concerning IEEE Standards Documents
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Updating of IEEE Standards documents
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Standard for Automatic Test
Markup Language (ATML) Test Adapter
Description

IMPORTANT NOTICE: IEEE Standards documents are not intended to ensure safety, security, health,
or environmental protection, or ensure against interference with or from other devices or networks.
Implementers of IEEE Standards documents are responsible for determining and complying with all
appropriate safety, security, environmental, health, and interference protection practices and all
applicable laws and regulations.
This IEEE document is made available for use subject to important notices and legal disclaimers.
These notices and disclaimers appear in all publications containing this document and may
be found under the heading “Important Notice” or “Important Notices and Disclaimers
Concerning IEEE Documents. ” They can also be obtained on request from IEEE or viewed at
http://standards. ieee. org/IPR/disclaimers. html.

1 . Overview
1 .1 General
Automatic test markup language (ATML) is a collection of IEEE standards and associated extensible
markup language (XML) schemas that allow automatic test system (ATS) and test information to be
exchanged in a common format adhering to the XML standard.

1

The ATML framework and the ATML family of standards have been developed and are maintained under
the guidance of the Test Information Integration (TII) Subcommittee of IEEE Standards Coordinating
Committee 20 (SCC20) to serve as a comprehensive environment for integrating design data, test
strategies, test requirements, test procedures, test results management, and test system implementations,
while allowing test program (TP), test asset interoperability, and unit under test (UUT) data to be
interchanged between heterogeneous systems.
2

This standard (as well as the XML schemas and XML instance document examples that accompany this
standard) is intended to be used in identifying and documenting test adapters which may be utilized during
the testing of a unit under test (UUT). This information includes the mechanical, electrical, and software

interfaces of the test adapter.

1

This information is given for the convenience of users of this standard and does not constitute an endorsement by IEEE of this

consortium standard. Equivalent standards or products may be used if they can be shown to lead to the same results.

2

The XML schemas and examples that accompany this standard are available at the locations defined in Clause 6.

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make s

use

o f XML

sc he mas

and

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XM L

terminolo gy.

Fo r

readers

ne w

to

XML,

the

XML

fo r

users,

S che ma T uto rial [ B 4 ] p ro vides a general intro ductio n.

1 .2 Application of this document’s annexes
T his do cument includes fo ur anne xes.

Annex

A

thro ugh

Anne x

D

are

info rmative;

thus

the y

are

p ro vided

strictly

as

info rmatio n

imple menters, and maintainers o f this do c ument.

1 .3 Scope
T his standard defines an exc hange fo rmat, utilizing XML, fo r b o th the s tatic descrip tio n o f a test adap ter b y
defining

the

interfac e

betwee n

the

UUT

and

the

te st

s tatio n,

and

the

sp ec ific

descrip tio n

of te st

adap ter

instance info rmatio n.

1 .4 Application

T his

standard

conformant

p ro vides

c oo perating

a

clear

definitio n

so ftware

of

c o mpo ne nts

te st
and

adap ter

info rmatio n

ap p lic ations.

T his

that

may

standard

be

exc hanged

p ro vides

a

b etwee n

definitio n

that

acco mp lis hes the fo llo wing o bj ec tives:

a)

P rovide a means of desc ribing the aspects of the te st adap ter, whic h is the interface betwee n the test
statio n and the UUT

b)

P ro vide a means o f describing simp le (e. g. , c ab le o nly) , p ass ive, o r active test adap ters

c)

P ro vide a means o f desc rib ing multip le or layered test adap ters

T he info rmatio n c o ntained in XML do c ume nts co nfo rming to this standard will b e use ful to :

a)

T est p rogram set (T P S ) develop ers

b)

TP S maintainers

c)

AT E s ys te m de velo p ers

d)

AT E s ys tem maintainers

e)

D evelo p ers o f AT ML-b ased to o ls and s ys te ms

f)

UUT develo p ers and maintainers

1 .5 Conventions used within this document
1 .5.1 General
In

acco rdance

Co urier fo nt.

with

the

IEEE Standards Style Manual

3

[B 3 ] ,

any

sc he ma

e xamp les

will

be

s ho wn

in

In c ase s where instance do cume nt example s are necessary to dep ic t the use o f a sche ma typ e

3

The numb ers in b rackets c orresp ond to those of the b ib liography in Annex D.


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or element, such examples will also be shown in Courier font. When the characters “. .. ” appear in an
example, it indicates that the example component is incomplete.
All simple types, complex types, attribute groups, and elements will be listed; explanatory information will
be provided, along with examples, if additional clarification is needed. The explanatory information will
include information on the intended use of the elements and/or attributes where the name of the entity does
not clearly indicate its intended use. For elements derived from another source type (e. g. , an abstract type),
only attributes that extend the source type will be listed; details regarding the base type will be listed along
with the base type.
When referring to an attribute of an XML element, the convention of [element] @[attribute] will be used. In
cases where an attribute name is referred to with no associated element, the attribute name will be enclosed
in single quotes. Element and type names will always be set in italics when appearing in text.
This standard uses the vocabulary and definitions of relevant IEEE standards. In case of conflict of
definitions, except for those portions quoted from standards, the following precedence shall be observed:
1 ) Clause 3 , and 2) The IEEE Standards Dictionary Online [B2] .

1 .5.2 Precedence
The TestAdapterDescription schema (TestAdapterDescription. xsd) element, child element, and annotation
information shall take precedence over the descriptive information contained in Clause 4.
The TestAdapterDescription schema and the material contained in Clause 4 shall take precedence over the
example information represented in Annex B.
The TestAdapterInstance schema (TestAdapterInstance. xsd) element, child element, and annotation

information shall take precedence over the descriptive information contained in Clause 5.
The TestAdapterInstance schema and the material contained in Clause 5 shall take precedence over the
example information represented in Annex B.

1 .5.3 Word usage
In accordance with the IEEE Standards Style Manual [B3 ] , the word shall is used to indicate mandatory
requirements strictly to be followed in order to conform to the standard and from which no deviation is
permitted ( shall equals is required to ). The use of the word must is used only to describe unavoidable
situations. The use of the word will is only used in statements of fact.
The word should is used to indicate that among several possibilities one is recommended as particularly
suitable, without mentioning or excluding others ( should equals is recommended that).
The word may is used to indicate a course of action permissible within the limits of the standard (may
equals is permitted to ).
The word can is used for statements of possibility and capability (can equals is able to ).

2. Normative references
The following referenced documents are indispensable for the application of this document (i.e. , they must
be understood and used, so each referenced document is cited in text and its relationship to this document is

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explained). For dated references, only the edition cited applies. For undated references, the latest edition of
the referenced document (including any amendments or corrigenda) applies.
IEEE Std 1 671 ™, IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging
Automatic Test Equipment and Test Information via XML.

4, 5

3. Definitions, acronyms, and abbreviations
3.1 Definitions
For the purposes of this document, the following terms and definitions apply. The IEEE Standards
6

Dictionary Online should be consulted for terms not defined in this clause. In the event a term is explicitly
redefined, or further defined in an ATML component standard, the component standards definition shall
take precedence for that ATML component standard.

abstract type:

A declared type that can be used to define other types through derivation. Only non-abstract

types derived from the declared type can be used in instance documents. When such a type is used, it shall
be identified by the xsi: type attribute.
automatic test markup language (ATML) instance document:

element:

See:

instance document.

A bounded component of the logical structure of an extensible markup language (XML)

document that has a type and that may have XML attributes and content. [adapted from Extensible Markup

Language (XML) 1 . 0 (Fifth Edition)]
entity:

Something that has a distinct separate existence.

extensible markup language (XML) attribute:

Name-value pair associated with an XML element.

extensible markup language (XML) document:

A data obj ect that conforms to the XML requirements

for being well-formed. In addition, the data obj ect is valid if it additionally conforms to semantic rules of
the XML schema.
extensible markup language (XML) schema:

The definition of a class of XML document, typically

expressed in terms of constraints on the structure and the content of documents of that class, above and
beyond the basic syntax constraints imposed by XML itself.
instance document:

obj ect:

An XML document that conforms to a particular XML schema.

An obj ect consists of state and behavior. An obj ect stores its states in fields (variables in some

programming languages) and exposes its behavior through methods (functions in some programming
languages).
well-formed:

4

Conforming to all of XML’ s syntax rules.

IEEE publications are available from The Institute of Electrical and Electronics Engineers, 445 Hoes Lane, Piscataway, NJ 08854,

USA ( />5
6

The standards or products referred to in this clause are trademarks of The Institute of Electrical and Electronics Engineers, Inc.

IEEE Standards Dictionary Online subscription is available at:

http://www. ieee.org/portal/innovate/products/standard/standards_dictionary. html.


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3.2 Acronyms and abbreviations
ATE

automatic test equipment

ATML

automatic test markup language

ATS

automatic test system

COM

common relay contact

DC

direct current

DCLVA

dc power supply low voltage type A

J

j ack

NC

normally closed relay contact

NO

normally open relay contact

P/N

part number

RF

radio frequency

S

switch

TB

terminal block

TII

test information integration

TP

test program

TPS

test program set

UTF-8

8-bit Unicode transformation format

UUT

unit under test

W3 C®

World Wide Web consortium

XML

extensible markup language

4. TestAdapterDescription schema

4.1 General
In addition to the conventions specified in 1 .5. 1 , the prefix “c: ” indicates that the element is defined by/is
inherited from the IEEE Std 1 671 ™-201 0 associated Common. xsd XML schema. The prefix “hc: ”
indicates

that the

element is

defined by/is

inherited from the

IEEE

Std 1 671 -201 0

associated

HardwareCommon.xsd XML schema. The prefix “te: ” indicates that the element is defined by/is inherited
from the IEEE Std 1 671 -201 0 associated TestEquipment.xsd XML schema.

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4.2 Elements
4.2.1 TestAdapterDescription root (or document)
Exactly one element exists, called the root, or document element, of which no part appears in the
content of any other element. This root element serves as the parent for all other elements of the
TestAdapterDescription schema.
The TestAdapterDescription schema’ s root element is defined as follows:

Name

Set to

Attribute form default

Unqualified (see NOTE)

Element form default

Qualified (see NOTE)

Encoding

UTF-8

Included schema

None

Imported schema

urn: IEEE-1 671 : 201 0: Common
urn: IEEE-1 671 : 201 0: HardwareCommon
urn: IEEE-1 671 : 201 0: TestEquipment

Target namespace

urn: IEEE-1 671 .5: 201 5: TestAdapterDescription

Version

2.2

XML schema namespace reference

a

NOTE—Qualified and unqualified are described in A. 3 .7 of IEEE Std 1 671 .
a

7

The namespace reference URL is: http: //www. w3 .org/2001 /XMLSchema.

4.2.2 TestAdapterDescription
Base type:

ta:TestAdapterDescription

Properties: content complex
The

TestAdapterDescription element shall be used to document the aspects of a family of test adapters.

4.2.2.1 Attributes
TestAdapterDescription

element inherits the attributes from

TestAdapterDesciption complex type

(see

4. 2. 3 ).

4.2.2.2 Child elements
TestAdapterDescription

element inherits the child elements from

(see 4. 2. 3 ).

TestAdapterDescription complex type

4.2.3 TestAdapterDescription complex type
Base type:

te:TestEquipment

Properties: content complex

7

Notes in text, tables, and figures are given for information only, and do not contain requirements needed to implement the standard.


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The test adapter description type will encompass all information necessary to identify all of the hardware,
software, and documentation in a test adapter.
Figure 1 illustrates the XML type inherited that comprises the

TestAdapterDescription .

Figure 1 —TestAdapterDescription complex type content
4.2.3.1 Attributes

TestAdapterDescription

contains the s

ecurityClassification, classified, name, version, and uuid attributes
DocumentRootAttributes attribute

inherited from the hc: HardwareItemDescription complex type and the
group defined in Annex B of IEEE Std 1 671 .

4.2.3.2 Child elements
TestAdapterDescription

inherits the child elements of

IEEE Std 1 671 .

te:TestEquipment

contained in Annex B of

4.3 Simple types
None.

5. Schema—TestAdapterInstance.xsd
5.1 General
In addition to the conventions specified in 1 .5. 1 , the prefix “

c: ” represents that the element is defined by/is
hc: ” indicates

inherited from the IEEE Std 1 671 -201 0 associated Common. xsd XML schema. The prefix “

that the element is defined by/is inherited from the IEEE Std 1 671 -201 0 associated HardwareCommon. xsd
XML schema.

The prefix “

te: ”

indicates

that the element is defined by/is

IEEE Std 1 671 -201 0 associated TestEquipment.xsd XML schema.

inherited from the

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5.2 Elements
5.2.1 TestAdapterInstance root (or document)
Exactly one element exists, called the root, or document element, of which no part appears in the content of
any other element. This root element serves as the parent for all other elements of the TestAdapterInstance
schema.
The TestAdapterInstance schema’ s root element is defined as follows:

Name

Set to

Attribute form default

Unqualified (see NOTE)

Element form default

Qualified (see NOTE)

Encoding

UTF-8

Included schema

None

Imported schema

urn: IEEE-1 671 : 201 0: Common
urn: IEEE-1 671 : 201 0: HardwareCommon
urn: IEEE-1 671 : 201 0: TestEquipment

Target namespace

urn: IEEE-1 671 .6: 201 5: TestAdapterInstance

Version

2. 1 2

XML schema namespace reference

a

NOTE—Qualified and unqualified are described in A. 3 .7 of IEEE Std 1 671 .
a

The namespace reference URL is: http: //www. w3 .org/2001 /XMLSchema.

5.2.2 TestAdapterInstance
Base type: tai:TestAdapterInstance
Properties: content complex
The TestAdapterInstance element shall be used to document the aspects of a particular instance of a test
adapter.

5.2.2.1 Attributes
TestAdapterInstance element inherits the attributes from TestAdapterInstance complex type (see 5.2. 3 ).

5.2.2.2 Child elements
TestAdapterInstance element inherits the child elements from TestAdapterInstance complex type (see
5. 2. 3).

5.2.3 TestAdapterInstance complex type
Base type: te:TestEquipmentInstance
Properties: content complex
The test adapter instance type will encompass all information necessary to identify all of the hardware,
software, and documentation of that particular test adapter serial number.


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5.2.3.1 Attributes
TestAdapterInstance inherits the securityClassification, classified, and uuid attributes inherited from the
DocumentRootAttributes attribute group defined in Annex B of IEEE Std 1 671 .

5.2.3.2 Child elements
TestAdapterInstance inherits the child elements of te:TestEquipmentInstance contained in Annex B of

IEEE Std 1 671 .

5.3 Simple types
None.

6. ATML TestAdapterDescription XML schema names and locations
IEEE provides a download website for material published in association with published IEEE standards,
presented in machine-friendly format. This material is digital rights management restricted use material.
The ATML family of standards utilizes this download website to allow easy accessibility to all of the
ATML family XML schemas (and in some cases, example XML instance documents). As depicted by

Figure 2 , the IEEE download website (http: //standards.ieee.org/downloads/) contains several folders, each
folder labeled by an associated IEEE standard number (e. g. , IEEE 1 671 series standards are in the 1 671
folder). Each folder under this base IEEE standard number contains the material (XML schemas, etc. ) for
that ATML family component standard. ATML family component standards are identified by their IEEE
1 671 series dot standard number and the year in which that standard was published by IEEE.
NOTE 1 —Standards that are revised will be contained in a folder for the year in which the standard is reissued. Both
folders (for each year the standard was published) will be present on the IEEE download website.
NOTE 2—Folders for a particular standard are not available until the standard is published by IEEE and providing the
standard has associated material that is to be made available via the download website.

Figure 2 depicts a portion of the entire IEEE download website as it pertains to the Test Adapter
Description ATML family standard.

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http: //standards. ieee. org/downloads/
1 671 /

1 671 - 2006

1 671 - 201 0

1 671 . 5-2008

1 671 . 5 - 20 1 5

Figure 2 —ATML test adapter related IEEE download website structure
The Test Adapter ATML family component standard, where the component is defined, their associated
XML schema names, and the IEEE download website folder name (where the XML schemas are located),
is as defined in Table 1 .

Table 1 —ATML family XML schema name and folder location
IEEE download website
Component

Test adapter
description
Test adapter instance

Defined in clause

XML schema name

folder (See Figure 2)

4

TestAdapterDescription.xsd

1 671 .5-201 5

5

TestAdapterInstance. xsd

1 671 .5-201 5

The XML schema identified in Table 2 includes ATML common elements: the ATML common element
(e.g. , component), where the component is defined, the associated XML schemas name, and the IEEE
download website folder name (where the XML schema are located).

Table 2 —ATML common element XML schema name and location
Defined in
Component

Common
Hardware common
Test equipment

IEEE Std 1 671 -201 0

Annex B. 1
Annex B. 2
Annex B. 3

IEEE download website
XML schema name

folder (See Figure 2)

Common. xsd

1 671 -201 0

Hardware Common. xsd

1 671 -201 0

TestEquipment. xsd

1 671 -201 0


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7. ATML XML schema extensibility
T he p ro visio n o f an e xte nsio n mec hanis m is neces sary to help ens ure the viab ility o f the sp ecificatio n and
allo w p ro duc ers
there

is

and co ns ume rs

a require me nt to

sche ma.

T he

extended

use

file

o f the

witho ut

of T est

exc hange
e xte nsio ns

erro r,

Adap ter i nstanc e

rele vant data that is

discard

shall
or

be

do ne

o therwise

in

do c ume nts

to

intero p erate

no t included in the

a

way

sidestep

that

the

a

co nfo rmant

exte nded

in tho se

Test Adapter

data,

co nsumer

and

use

c ases

where

asso ciated XML
c an

the

utilize

the

no n-e xte nded

p o rtio ns o f the data as it is intended, witho ut erro r o r lo ss o f func tio nality.

Extensions
Extensions

shall b e additio nal info rmatio n added to the co nte nt mo del o f the ele ment b eing extended.

shall no t repackage existing info rmation e ntitie s that are already sup ported by the

Test Adapter

XML sc he ma.

An e xtended instance

document s hall

be

acc o mp anied b y the

e xtension XM L sc he ma and doc ume ntatio n

sufficie nt to exp lain the need fo r the exte nsio n as well as the underlying s e mantic s and relatio ns hip (s) to the
base

Test Adapter

XML sc he ma.

T he AT ML family of s tandards asso c iated XM L sc he mas allo w fo r three fo rms o f exte nsion:

a)

Wildcard-b ased extensio ns allo w fo r the exte nsio n o f the XML sc he mas with additio nal e le me nts

b)

T yp e derivatio n allo ws fo r extending the set o f data typ es b y deriving a ne w typ e fro m an exis ting

commo n ele me nt type

c)

Lis ts derived fro m

c:NamedValues

allo wing user defined p ro perties with attac hed val ues

8. Conformance
T his

clause

sp ecifies

the

re quire me nts

that

must

be

satisfied

to

c laim

c o nfo rmance

to

this

standard.

Co nfo rmance is defined fo r the fo llo wing ite ms:

a)

A T estAdap terD esc riptio n instance doc ume nt

b)

A T estAdap terInstance instance do cument

Extensio ns are p ermitted to b o th the T estAdap terD escrip tio n and T estAdap terInstance do cume nts b ut s hall
only
W3 C

oc c ur
XML

through
sche ma

the

fac ility

standard,

o f the

an

e xte nsib ility

extended

sc he ma

mec hanis m
s hall

desc rib ed

c onform to

the

in

C lause

W3 C

XM L

7.

As

defined

sche ma

in

the

sp ecific atio n

and shall no t describ e any e ntities defined in the b ase sc he ma.

8.1 Conformance of a TestAdapterDescription instance document
A do cume nt shall co nfo rm as a T estAdap terD escrip tio n ins tance do c ument if it satis fies all o f the fo llo wing
co nditio ns:

a)

T he do c ume nt satis fies the require me nts fo r a we ll-fo rmed XML do c ument

b)

T he root eleme nt o f the XM L do cument is a T estAdapterD e sc rip tio n ele me nt

c)

T he

co ntents

o f the

XM L

do cume nt

are

valid

sc he ma, inc luding imp o rted XML sc he mas

with

resp ec t

to

the

T estAdap terD escrip tio n

XML

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d)

The contents of the XML document satisfy the requirements stated in Clause 4

e)

The contents of the XML document satisfy the requirements stated in the annotations of the
TestAdapterDescription XML schema, including requirements stated in the annotations of imported

XML schemas

f)

Extensions, if any, satisfy the requirements stated in Clause 7

8.2 Conformance of a TestAdapterInstance instance document
A document shall conform as a TestAdapterInstance instance document if it satisfies all of the following
conditions:
a)

The document satisfies the requirements for a well-formed XML document

b)

The root element of the XML document is a TestAdapterInstance element

c)

The contents of the XML document are valid with respect to the TestAdapterInstance XML
schema, including imported XML schemas

d)

The contents of the XML document satisfy the requirements stated in Clause 5

e)

The contents of the XML document satisfy the requirements stated in the annotations of the
TestAdapterInstance XML schema, including requirements stated in the annotations of imported

XML schemas

f)

Extensions, if any, satisfy the requirements stated in Clause 7


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Annex A
(informative)

IEEE download website material associated with this document
This document includes supporting material required to maintain and/or develop the ATML framework as
well as maintain the ATML family of standards. This material is published by IEEE in association with this
document, presented in a machine-friendly format. This is digital rights management restricted use
material. The ATML family of standards utilizes this download website to allow easy accessibility to these
documents’ XML schemas and associated material referenced within this document (e. g., examples or
committee drafts). For an explanation and the location of the IEEE download website and its structure (as it
pertains to the ATML family of standards), see Clause 6. The material available on the IEEE download
website in association with this document is described in Table A.1 .

Table A.1 —IEEE download website contents
File
TestAdapterDescription. xsd
TestAdapterInstance.xsd

Description
The ATML Test Adapter Description schema defined in Clause 4
The ATML Test Adapter Instance schema defined in
Clause 5

1 671 _5_TestAdapterExample.xml

Example

1 671 _5_TestAdapterExampleInstance.xml

Example

Readme.txt

This file contains user information pertaining to the files posted,
related files, and their usage

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