Volume 10 - Materials Characterization Part 13 pptx

Images of Alloys and Semiconductors
Quantitative Analysis of Field Ion Microscopy Images
N hkl
θ
r θ N d hkl
(Eq 7)
d hkl hkl
rθ
Science,
Field Ion Microscopy, Principles and Applications,
Surf. Sci.,
J. Phys. F. (Met. Phys.),
et al., Philos. Mag.,
The Principle of the Atom Probe
v
(Eq 8)
m ne V
(Eq 9)
L t
m n
(Eq 10)
V V αV
(Eq 11)
α
(Eq 12)
V t L
Instrument Design and Operation
μ
Mass Spectra and Their Interpretation

m n
α
m n
•
•
•
•
Table 4 Atom probe analysis of chromium-molybdenum
Element Wet
chemical

Steel
carbide

analysis,

at.%
carbide

analysis,

at.%

1.5
0.8
0.9
ND
0.6
0.3
0.07

0.07
Iron bal 2.6 bal
Composition Profiles
d
Alternate Forms of Data Representation
R k
(Eq 13)
c
i
c
i k
i i k c
n k
i i k R k
k
k
Requirements for Quantitative Analysis
N x n
x
σ n
x
(Eq 14)
T T
T
γ γ
Table 5 Analysis of high-purity 18Cr-12Ni austenitic stainless steel
Element Bulk
analysis,

at. %

18.8 ± 0.80

12.1 ± 0.7
0.6 ± 0.15
Iron bal bal
Factors Limiting Spatial Resolution
The Imaging Atom Probe (lAP)
The High-Resolution Energy-Compensated Atom Probe (ECAP)
The Pulsed Laser Atom Probe (PLAP)
Surface and Interface Analysis,
Proceedings of Phase Transformations Conference,
Metall. Trans. A,
J. Phys. (Orsay),
Element


46.47
18.23
24.47
3.98
4.37
0.62
0.44
0.61
0.71
0.05

Zirconium

0.06
Table 6 Four-stage heat treatment of alloy IN 939
Temperature
°C °F
Time,

h


Air cool
Air cool
Air cool
700 1290 16 Air cool
γ
γ γ
γ
γ γ
σ
Table 7 Analyses of γ and γ' phases in IN 939
Element γ, at.%
γ

61.4
9.8
1.5
11.7
13.8
1.7

0.03
Carbon 0.04 0.04
γ γ
γ
Table 8 Secondary γ' precipitate compositions in IN 939
Element Analysis 1

at.%
Analysis 2

at.%
Analysis 3

at.%

68.1
3.2
1.4
13.8
11.4
0.9
Tantalum 1.6 . . . 1.6 1.2
γ γ γ
γ